Rohde & Schwarz hosts RF Testing Innovations Forum 2025, helping design engineers elevate their RF expertise

Rohde & Schwarz hosts RF Testing Innovations Forum 2025, helping design engineers elevate their RF expertise Taking place over two days, Rohde & Schwarz and industry partners will be providing a virtual platform for RF design engineers to enhance their RF expertise and engage with industry leaders at the forefront of innovation. The online event will feature informative presentations by experts from Rohde & Schwarz, The University of Cardiff, Maury Microwave, Qorvo, MathWorks, Analog Devices and Greenerwave.

At the RF Testing Innovations Forum attendees can learn about the latest innovations and trends in RF testing. (Image: Rohde & Schwarz)

At the virtual RF Testing Innovations Forum 2025, taking place from May 20 to 21, 2025, design engineers will be able to gain invaluable insights into the latest advancements in RF testing methodologies and technologies. Led by experts from Rohde & Schwarz and industry partners, the two-day event will explore the critical factors expected to shape the future of RF testing.

Agenda highlights of Session 1

Day one of the two-day online event will start by covering subjects such as how to enhance the accuracy of mmWave non-linear vector network analyzers, which monitor harmonic distortion, intermodulation and other non-linear effects that can influence mmWave system performance.

Participants will discover innovative approaches to wideband modulated load pull including how to address typical limitations. This novel approach to RF front-end testing uses an R&S RTP oscilloscope plus an R&S SMW200A wideband vector signal generator. The experts will then take a look at the importance of achieving stable and accurate test levels using closed-loop power control. Areas covered will include supported signal forms, suitable test instrumentation and what needs to be considered to achieve the best results.

Two further presentations will take place before the first day's session closes at 1:00 pm. One presentation will explore load pull techniques for next generation sub-THz components while the next will look at how to characterize wideband active RF components using real-world stimulus signals, in particular how using a fully modulated signal can speed up the overall testing process as it offers deep insights in a single measurement.

Agenda highlights of Session 2

Day two will open with a keynote interview exploring the evolution of vector network analyzers, considering growing demand for faster and more accurate test solutions while keeping costs down. RF components are becoming more sophisticated, having more features integrated into them and offering unseen performance and frequency coverage, posing new challenges to RF design engineers.

This will be followed by a presentation on dealing with the challenges of on-wafer characterization of bulk acoustic wave (BAW) filter harmonics, especially in achieving accurate measurements and minimizing distortions. The speaker will outline how to use an advanced probing technique when characterizing the second harmonic (H2) performance of BAW filters.

The next presentation will look at how to accelerate antenna pattern analysis and simulation using MATLAB . There will be a particular focus on building the full 3D radiation pattern from a subset of 2D pattern measurements using analytical methods and AI techniques. Participants will also learn how to integrate the measured data into a system level simulation model for wireless communication and radar systems. A talk on dataset acquisition optimization for AI-controlled electronically steerable antennas will then take place before a break.

The RF Testing Innovations Forum 2025 will conclude with a presentation on advanced measurement techniques for ultra-wideband software-defined radios and an outline of the role of the R&S ZNB3000 VNA in RF front-end (RFFE) production.

Click for further details about this free-of-charge virtual event and to register for the sessions.

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