Rohde & Schwarz Oscilloscope Days 2025 provide expert knowledge for day-to-day testing challenges

Rohde & Schwarz Oscilloscope Days 2025 provide expert knowledge for day-to-day testing challenges Returning in April 2025, the popular Oscilloscope Days event provides essential information to support design engineers with day-to-day test challenges, and insights into how to stay ahead in a world that is increasingly embracing electrification and digitalization. The two half-day virtual event includes online theoretical and practical sessions, application-oriented presentations and interactive discussions with experts from Rohde & Schwarz and event partners.

Rohde & Schwarz Oscilloscope Days 2025 provide expert knowledge for day-to-day testing challenges.

Rohde & Schwarz hosts once again its popular Oscilloscope Days event, taking place over two half days, April 2 to 3, 2025. The event will be held online, and once again draw on the expertise of oscilloscope specialists from Rohde & Schwarz, as well as long-time event partners W rth Elektronik and PE Systems. The live event will be streamed in English.

This year's event recognizes that engineers are tasked with boosting device functionality and minimizing power consumption, weight and size, while at the same time ensuring continuous interoperability. Experts will deliver educational insights into how these goals can be achieved using an oscilloscope and diligently selected probes and accessories.

Day one of Oscilloscope Days 2025 will open with a keynote speech that outlines the interrelationship required between semiconductor technologies to optimize performance of an electric power processing system, while ensuring product compliance. Leonardo Montoya from Wolfspeed will explain the close correlation between advances in novel microelectronics and power semiconductor devices. He will also look at the significant implications for system-level integration and present a clear pathway for overcoming challenges.

The first day will continue with a presentation on how to choose the best oscilloscope and probe for a particular application, including how much bandwidth and sampling rate would be required, digital trigger systems and acquisition rates. Rohde & Schwarz will also cover probe fundamentals, including understanding the different types, how to connect to the DUT, the effect it will have on the signal and how to read it.

Delegates will then hear from specialists at W rth Elektronik and Rohde & Schwarz, on key issues such as how to deal with AC losses and overcoming challenges when testing Wide Bandgap (WBG) devices - such as Silicon Carbide (SiC) and Gallium Nitride (GaN). The WBG session will focus on how to choose the right equipment for such test challenges as higher current and voltage slew rates, isolated gate drives and wideband current measurements. The presentation will also describe the best ways to isolate measurement equipment as well as deciding how much isolation is required. Finally, the benefits of using an optical isolated probe for high-side measurements (as well as current shunt measurements) will be covered.

Day two of Oscilloscope Days 2025 will start with a deep dive into power inductor saturation and using the various functions provided by the MXO oscilloscope from Rohde & Schwarz, with its high bandwidth and fast sampling rate, accurate current measurements and waveform analysis. Presenters from W rth Elektronik and PE-Systems will look at the effects of different temperatures and the impact of construction and core material. They will continue with how to use double pulse testing in a model-based approach to achieve robust designs in short development cycles, especially in power electronics.

Later that morning, live demonstrations will focus on signal integrity analysis of NRZ (Non-Return-to-Zero) and PAM (Pulse Amplitude Modulation) signals in high-speed digital systems, covering advanced test solutions for PAM analysis and exploring equalization and embedding to optimize signal fidelity.

The final session will address in detail electromagnetic interference (EMI) debugging and pre-compliance measurements, and processes that no longer need to be time-consuming and expensive to carry out. In a practical demonstration, Rohde & Schwarz experts will look at the typical tools and techniques that can lead to reduced costs and improved efficiency by helping to identify and resolve EMI issues quickly. There will also be an illustration of how to carry out conducted emissions pre-compliance measurement using a spectrum analyzer and oscilloscope.

Philip Diegmann, Vice President Oscilloscopes at Rohde & Schwarz, said: We are pleased to work closely with our partners to ensure events like Oscilloscope Days take place, so that the latest knowledge can be shared with the design engineer community and help support everyday tasks. These two days will focus on the fundamentals for those new to the profession as well as the latest techniques and technologies for more experienced engineers who are tasked with having to meet an ever-wider range of measurement challenges.

For further information and to register for the Oscilloscope Days 2025 event, please visit: https://rohde-schwarz.com/oscilloscope-days

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